NYUAD X-ray Instrumentation Portfolio
Our laboratory is equipped with a suite of state-of-the-art X-ray instruments designed to meet a broad range of analytical needs, from atomic-resolution crystallography to nanostructural characterization. Below is an overview of each system’s configuration and its principal applications.
Single-Crystal X-ray Diffractometers
- Bruker D8 APEX Duo
Features dual-wavelength X-ray sources—CuKα (λ = 1.5418 Å) and MoKα (λ = 0.7107 Å)—paired with the highly sensitive PHOTON II CMOS detector. This setup offers exceptional flexibility and resolution for single-crystal studies across a wide range of sample types.
- Rigaku XtaLab Synergy-DW VHF (anticipated installation: July 2025)
Equipped with a high-flux rotating-anode X-ray generator supporting both CuKα and MoKα radiation, and the cutting-edge HyPix-Arc 150HE direct detection photon-counting detector, this system is optimized for rapid, high-precision structure elucidation, including challenging or weakly diffracting crystals.
Primary Applications:
Atomic-level structure determination of organic, inorganic, and biomolecular crystals, including small molecules and proteins.
Powder X-ray Diffractometers
- PANalytical Empyrean (2nd & 3rd Generation Models)
Integrated with a CuKα (λ = 1.5418 Å) X-ray source and a PIXCEL 1D detector, these systems are further enhanced by versatile sample handling and environment options, such as:
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- High-temperature stages (up to 1200°C)
- Low-temperature stages (down to 100 K)
- Five-axis goniometric positioning
- Parallel beam optics and mirror attachments
- Capillary stages for air-sensitive or limited-volume samples
Primary Applications:
Phase identification, in situ diffraction under thermal conditions, grazing incidence diffraction (GID), X-ray reflectivity (XRR), and high-resolution techniques such as rocking curve measurements.
Small-Angle X-ray Scattering (SAXS) System
- Anton Paar SAXSpoint 5.0
Utilizing a CuKα (λ = 1.5418 Å) source and the advanced Eiger 1M detector, this instrument provides high-throughput and high-resolution capabilities for nanostructural analysis. Equipped with:
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- Temperature-controlled stages ranging from −15°C to 150°C
- GI-SAXS stage for probing oriented or thin-film samples
Primary Applications:
Quantitative analysis of nanoscale structures, including particle size, shape, and internal morphology. Ideal for investigating anisotropic two-dimensional diffraction patterns, particularly in soft matter, colloidal systems, and nanocomposites.